Details
Darstellung elektrischer Funktionen einer integrierten Schaltung im Raster-Elektronenmikroskop
[Other Title]
Use of Scanning Electron Microscope for Representation of Electrical Processes in an Integrated Circuit [Title Translation]
Use of Scanning Electron Microscope for Representation of Electrical Processes in an Integrated Circuit [Title Translation]
Year of origin: | 1977 |
Genre: | Documentary Film |
Locations of shooting: | n/a
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Credits |
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Production company: |
Siemens AG, Zentrale Forschung und Entwicklung, Forschungslaboratorien (München
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IWF (Göttingen)
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First released by: |
IWF (Göttingen)
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Distributor: |
IWF (Göttingen)
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Producer: |
Günter Hummel
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Author: |
Johann Otte
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Hans Rehme
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Eckhard Wolfgang
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Keywords: | Halbleiter, integrierte, Integrierter Schaltkreis, Schaltung, integrated circuit, semiconductor |