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Darstellung elektrischer Funktionen einer integrierten Schaltung im Raster-Elektronenmikroskop   [Other Title]

Use of Scanning Electron Microscope for Representation of Electrical Processes in an Integrated Circuit   [Title Translation]
Année de production: 1977
Genre: Documentary Film
Lieu de tournage: n/a

Générique:
Production company: Siemens AG, Zentrale Forschung und Entwicklung, Forschungslaboratorien (München
  IWF (Göttingen)
First released by: IWF (Göttingen)
Distributor: IWF (Göttingen)
Producer: Günter Hummel
Author: Johann Otte
  Hans Rehme
  Eckhard Wolfgang


Mot-clés: Halbleiter, integrierte, Integrierter Schaltkreis, Schaltung, integrated circuit, semiconductor
Electrical switching states of an integrated circuit are displayed by a scanning electron microscope operated in the voltage contrast mode. Using an integrated circuit designed for telecommunication applications as an example, the film demonstrates switching operations at a frequency of a few Hz: function activation by clock pulsing, data input, memory addressing, the transfer of information to the memory and the read out of stored information.

Version 1
Langue: deu, eng
Son: Sound film
Aspect: n/a
Durée: 7 1/2 min

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Version 2
Langue: deu, eng
Son: Sound film
Aspect: n/a
Durée: 7 1/2 min

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Version 3
Langue: deu, eng
Son: Sound film
Aspect: n/a
Durée: 7 1/2 min

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Longueur 80 m Request Copy Button
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Information Copyright IWF Institut Wissen und Medien gGmbH